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Registro 1 de 1, Base de información BIBCYT Communications of the ACM ISSN:0001-0782
December 2006

Referencias Analíticas

* What can context do for Web Services? Maamar, Zakaria pp. 98-103

* Web Site Success Metrics: Addressing the Duality of Goals Belanger, France ; Fan, Weiguo ; Schaupp, L. Christian ; Krishen, Anjala ; Everhart, Jeannine ; Poteet, David ; Nakamoto, Kent pp. 114-116

* The Challenges Of Broadening The Scope Of Software Product Families Bosch, Jan pp. 41-44

* Software Product Line Testing Pohl, Klaus ; Metzger, Andreas pp. 78-81

* Software Product Line Modeling Made Practical Eriksson, Magnus ; Börstler, Jürgen ; Borg, Kjell pp. 49-53

* Software Product Line Engineering Sugumaran, Vijayan ; Kang, Kyo C. ; Park, Sooyong pp. 29-32

* Software Frameworks for Advanced Procurement Auction Markets Bichler, Martin ; Kalagnanam, Jayant R. pp. 104-108

* Robots Make Computer Science Personal Blank, Douglas pp. 25-27

* RFID and the end of Cash? Angell, Ian ; Kietzmann, Jan pp. 90-96

* Product Management for Software Product Lines: An unsolved problem? Helferich, Andreas ; Schmid, Klaus ; Herzwurm, Georg pp. 66-67

* New Methods In Software Product Line Practice Krueger, Charles W. pp. 37-40

* Multi-Level Customization in Application Engineering Czarnecki, Krzysztof ; Antkiewicz, Michal ; Peter Kim, Chang Hwan pp. 61-65

* Multi-Agent System Product Lines: Challenges and Benefits Peña, Joaquin ; Hinchey, Michael G. ; Ruiz-Cortés, Antonio pp. 82-84

* Liability Risks in Reusing Third-Party Software Hasselbring, Wilhelm pp. 144

* How They Manage IT: SMEs in Canada and the U.S. Montazemi, Ali Reza pp. 109-112

* Getting There From Here: A Roadmap For Software Product Line Adoption Clements, Paul C. ; McGregor, John D. ; Northrop, Linda M. ; Jones, Lawrence G. pp. 33-36

* Fungible Credentials and Next-Generation Fraud Berghel, Hal pp. 15-19

* Formal Verification and Software Product Lines Kishi, Tomoji ; Noda, Natsuko pp. 73-77

* Feature-Oriented Variability Management in Product Line Engineering Lee, Jaejoon ; Muthig, Dirk pp. 55-59

* Change Management Patterns in Software Product Lines Mohan, Kannan ; Armes, Balasubramaniam pp. 68-72

* Automated Analysis of Feature Models: Challenges Ahead Batory, Don ; Benavides, David ; Ruiz-Cortes, Antonio pp. 45-47

* A Quality-Based Cost Estimation Model for the Product Line Life Cycle In, Hoh Peter ; Boehm, Barry ; Baik, Jongmoon ; Kim, Sangsoo ; Yang, Ye pp. 85-88

 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 

UCLA - Biblioteca de Ciencias y Tecnologia Felix Morales Bueno

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